Crystalline Si solar cells based on thin wafers, with thicknesses in the range of 5–50 μm, can find applications in a wide range of markets where flexibility and bendability are important. For these cells, avoiding standard macroscopic texture is desirable to increase structural integrity. Herein, a nanopatterned SiN
x
antireflection (AR) coating that consists of 174 nm‐radius and 118 nm‐high SiN
x
nanodisks arranged in a square lattice on a thin (59 nm) SiN
x
layer is introduced. This geometry combines Fabry–Pérot AR and forward scattering by a resonant Mie mode to achieve high transmission into the Si absorber over a broad spectral band. The nanostructured coating is patterned on a commercial interdigitated‐back‐contact (IBC) Si solar cell, experimentally demonstrating a short‐circuit current density (J
sc) of 36.9 mA cm−2, 2.3 mA cm−2 higher than for a single‐layer AR coated cell, and an efficiency of 16.3% at a thickness of around 100 μm. It is shown that light incoupling efficiency is comparable to that of pyramidal texturing, while the absorption in the infrared is lower, due to less‐effective light trapping. Overall, nanopatterned SiN
x
broadband AR coatings are an appealing option for improving light management in ultrathin solar cells and other optoelectronic devices.