1994
DOI: 10.1016/0039-6028(94)90644-0
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Inelastic interactions of electrons with surfaces: application to Auger-electron spectroscopy and X-ray photoelectron spectroscopy

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Cited by 51 publications
(16 citation statements)
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“…The nitrogen concentration was four times higher on the CH 3 substrate compared to the PEG substrate. This value can be related to the effective ratio of the amounts of adsorbed collagen on the two substrates, but it is also influenced by the organization of the two protein films 45. For the CH 3 substrate (Figure 3 B), the AFM images show supramolecular structures protruding from a smooth background in a random fashion, as previously observed under similar conditions on a wide range of hydrophobic surfaces 7.…”
Section: Resultssupporting
confidence: 66%
“…The nitrogen concentration was four times higher on the CH 3 substrate compared to the PEG substrate. This value can be related to the effective ratio of the amounts of adsorbed collagen on the two substrates, but it is also influenced by the organization of the two protein films 45. For the CH 3 substrate (Figure 3 B), the AFM images show supramolecular structures protruding from a smooth background in a random fashion, as previously observed under similar conditions on a wide range of hydrophobic surfaces 7.…”
Section: Resultssupporting
confidence: 66%
“…Shelton 24 derived IMFPs for jellium with r s ϭ1.5, 2.0, 3.0, and 4.0 that were based on Lundqvist's calculations. The Quinn 20 and Shelton IMFPs are expected to be reasonable estimates for the so-called free-electron-like solids ͑e.g., elemental solids that are not transition or noble metals͒ where the predominant form of inelastic scattering is plasmon excitation ͑volume or bulk plasmons in the bulk of the solid and surface plasmons near a bulk-vacuum interface 13,[16][17][18] ͒. It should also be noted that the Lundqvist-Shelton IMFPs were computed for relatively low electron energies ͑to a maximum energy of about 500 eV for r s ϭ1.5͒ and to smaller maximum energies for the larger values of r s .…”
Section: Methods For Calculating Electron Imfpsmentioning
confidence: 99%
“…It is convenient to describe inelastic electron scattering in solids by a complex dielectric constant ⑀(,q) which is a function of frequency and momentum transfer q. [11][12][13][14][15][16][17] For qϭ0, the dielectric constant is related to the index of refraction n, the extinction coefficient k, and the optical ͑often x-ray͒ absorption coefficient m by:…”
Section: Electron Inelastic Mean Free Pathsmentioning
confidence: 99%
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“…Shifts of the Co L 3 M 45 M 45 Auger line show that Co atoms are in different chemical environments [8]. For 23 ML Co/Ge (1 1 1), the Auger line located at 775 eV and entirely comes from pure cobalt on the top Co layers because the inelastic mean free path of Auger electrons is about 1.2 nm [9,10]. Lower kinetic energy of the Co Auger line for 2.7 ML Co/ Ge (1 1 1) is attributed to the larger electronegativity of Ge than Co, while intermixing of Co and Ge occurs at the interface [11].…”
mentioning
confidence: 99%