2008 Joint Non-Volatile Semiconductor Memory Workshop and International Conference on Memory Technology and Design 2008
DOI: 10.1109/nvsmw.2008.31
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Influence and Comparison of Cu and Alu Metallization Schemes on Endurance of Embedded Flash Memories

G. Tempel
1
,
F. Erler
2
,
Jens Fruehauf
3
et al.
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