2013
DOI: 10.7567/jjap.52.08jf01
|View full text |Cite
|
Sign up to set email alerts
|

Influence of Carrier Lifetime, Transit Time, and Operation Voltages on the Photoresponse of Visible-Blind AlGaN Metal–Semiconductor–Metal Photodetectors

Abstract: We investigated the influence of lifetime and transit time of photogenerated carriers on the performance of visible-blind Al0.25Ga0.75N metal–semiconductor–metal photodetectors by a combination of experimental studies and numerical simulations. Good agreement between simulated and measured current–voltage (I–V) characteristics was achieved for several geometries of the interdigitated contact structure. Simulations of the external quantum efficiency (EQE) at low bias voltages showed that a long hole lifetime in… Show more

Help me understand this report

Search citation statements

Order By: Relevance

Paper Sections

Select...
1
1
1

Citation Types

0
3
0

Year Published

2015
2015
2021
2021

Publication Types

Select...
5

Relationship

1
4

Authors

Journals

citations
Cited by 9 publications
(3 citation statements)
references
References 15 publications
0
3
0
Order By: Relevance
“…To study the photo-response dynamics in layer-edge surface devices, we measured the time-dependent photo current of 2D perovskites ( n = 1, 2, 3) and 3D perovskites. The timescales of photo-response dynamics measurement are quite larger than the carrier of lifetime in regular time-resolved photoluminescence measurement, since the external electric field will dissemble the electron–hole pairs in the excitons, and effectively extend the carrier lifetime 25 . The response time τ is defined by the duration of photo current changing from 10 to 90% of the maximum and vice versa.…”
Section: Resultsmentioning
confidence: 99%
“…To study the photo-response dynamics in layer-edge surface devices, we measured the time-dependent photo current of 2D perovskites ( n = 1, 2, 3) and 3D perovskites. The timescales of photo-response dynamics measurement are quite larger than the carrier of lifetime in regular time-resolved photoluminescence measurement, since the external electric field will dissemble the electron–hole pairs in the excitons, and effectively extend the carrier lifetime 25 . The response time τ is defined by the duration of photo current changing from 10 to 90% of the maximum and vice versa.…”
Section: Resultsmentioning
confidence: 99%
“…The optical intensity I opt has been fixed for all wavelengths to a value of 1 mW cm −2 corresponding to the experimental situation at 300 nm wavelength. Carrier recombination lifetimes of τnormaln=1 ns and τnormalp=30 ps as well as mobility values of μnormaln=200 cm2normalV1s1 and μnormalp=5 cm2normalV1s1 have been assumed . The ionized donor concentration N D was initially set to 3 × 10 16 cm −3 for any layer in the structure.…”
Section: Simulation Procedures For Algan Msm Pdsmentioning
confidence: 99%
“…At the end of 2015, the same group reported an EQE of up to 67% at 50 V in a bottom-illuminated 500 nm-thick Al 0.50 Ga 0.50 N absorber layer of an MSM-based PD [485] . Apart from the influence of absorbance layers, the effects of asymmetric electrodes on the EQE of bottom-illuminated Al 0.40 Ga 0.60 N-and Al 0.50 Ga 0.50 N-based MSM PDs have also been discussed [483,501] .…”
Section: Photodetectorsmentioning
confidence: 99%