1992
DOI: 10.1016/0038-1098(92)90503-2
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Influence of carrier recombination on the pulsed photothermal beam deflection signal in semiconductors

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Cited by 8 publications
(3 citation statements)
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“…Cheng and Zhang's theory predicts the existence of the dip in photothermal refraction also, where it has been experimentally observed. 7, 26 We have not observed the predicted dip in our photothermal displacement experiments for either GaAs or InGaAs/AlGaAs MQW. It is perhaps not surprising that we do not observe the effect of the diffusion of photogenerated carriers because the recombination time in a direct band gap semiconductor like GaAs is expected to be very short and the parameter ␤ is small.…”
Section: Theorymentioning
confidence: 62%
“…Cheng and Zhang's theory predicts the existence of the dip in photothermal refraction also, where it has been experimentally observed. 7, 26 We have not observed the predicted dip in our photothermal displacement experiments for either GaAs or InGaAs/AlGaAs MQW. It is perhaps not surprising that we do not observe the effect of the diffusion of photogenerated carriers because the recombination time in a direct band gap semiconductor like GaAs is expected to be very short and the parameter ␤ is small.…”
Section: Theorymentioning
confidence: 62%
“…A PDS é uma técnica muito sensível para o estudo de vários parâmetros de transporte em filmes de semicondutores, como, por ex., difusividade térmica, difusividade eletrônica e velocidade de recombinação de superfície 36 . Mathew et al 37 empregaram a PDS para medida da difusividade térmica de diferentes composições de filmes finos de semicondutores amorfos Ge x Se 100-x .…”
Section: O Efeito Miragem De Temperaturaunclassified
“…Opsal and Rosencwaig (1985) introduced their investigation of semiconductors based on the results shown by Rosencwaig et al (1983). Petrovsky et al (1992) studied the influence of carrier recombination on the pulsed photothermal beam deflection signal in semiconductors, while Surnev and Ivanov (1992) investigated the thermal diffusivity measurements in semiconductors and the influence of the carrier diffusion and recombination. Kuo et al (1992) studied the thermal conductivity and interface thermal resistance of Si film on Si substrate determined by photothermal displacement interferometry.…”
Section: Introductionmentioning
confidence: 99%