2007
DOI: 10.1007/s10854-007-9270-0
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Influence of deposition parameters on preferred orientation of RF magnetron sputtered BST thin films

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Cited by 6 publications
(4 citation statements)
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“…Owing to their multifunctional electro-optical properties, ferroelectric perovskite thin films are attractive materials for a wide range of applications including, decoupling capacitors, infrared detectors, and microwave tunable devices, such as phase shifters, resonators, and filters [1][2][3][4][5]. Among the ferroelectric materials family, BaSrTiO x (BST) thin films recently received significant attention due to their potential for high performance electronic devices due to the superior tunability, low loss, room temperature (RT) operation, and additionally being lead-free tunable perovskite [6][7][8].…”
Section: Introductionmentioning
confidence: 99%
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“…Owing to their multifunctional electro-optical properties, ferroelectric perovskite thin films are attractive materials for a wide range of applications including, decoupling capacitors, infrared detectors, and microwave tunable devices, such as phase shifters, resonators, and filters [1][2][3][4][5]. Among the ferroelectric materials family, BaSrTiO x (BST) thin films recently received significant attention due to their potential for high performance electronic devices due to the superior tunability, low loss, room temperature (RT) operation, and additionally being lead-free tunable perovskite [6][7][8].…”
Section: Introductionmentioning
confidence: 99%
“…It is well known that film characteristics are strongly affected by the growth parameters such as substrate temperature, oxygen pressure and annealing [7,9,10,19]. Numerous studies on BST thin films have been reported in the recent years, however these efforts mainly concentrated on the determination of a single physical property (i.e., either the structural, optical, or electrical properties) [18][19][20][21][22].…”
Section: Introductionmentioning
confidence: 99%
“…Li. et al [48] deposited Ba 0.65 Sr 0.35 TiO 3 (BST) films and observed significant changes in film properties with variation in deposition pressure. It was deduced that the orientation of the deposited thin film could be tailored by adjusting the sputtering pressure.…”
mentioning
confidence: 99%
“…Fonte: Autor Tabela 6 -Cálculo do tamanho de cristalito em função da potência de rf, da relação oxigênio argônio e da temperatura de deposição para filmes finos de BST depositados sobre Si. Diversas referências bibliográficas reportam o aumento da cristalinidade dos filmes de BST com o aumento da temperatura de deposição (HORIKAWA et al, 1993); (LI et al, 2007). Em resumo foi observado que o aumento tanto da temperatura de deposição quanto da potência de rf levaram a uma melhora da cristalinidade dos filmes, ou seja, o aumento da energia associada ao processo de deposição melhora a cristalinidade dos filmes.…”
Section: unclassified