2017
DOI: 10.1109/ted.2017.2654262
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Influence of Different Gate Biases and Gate Lengths on Parasitic Source Access Resistance in AlGaN/GaN Heterostructure FETs

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Cited by 50 publications
(49 citation statements)
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“…R can be determined by the scattering theories of the 2DEG electrons in AlGaN/GaN HFETs 31,38,4650 .…”
Section: Resultsmentioning
confidence: 99%
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“…R can be determined by the scattering theories of the 2DEG electrons in AlGaN/GaN HFETs 31,38,4650 .…”
Section: Resultsmentioning
confidence: 99%
“…In AlGaN/GaN HFETs, the 2DEG electrons can be written as Ψ( x , y , z ) =  A −1/2 ψ ( z )exp( ik x x  +  ik y y ) 31,38,46,48,50 . Here A is the normalization constant, k x , k y refer to the components of k in the x -direction and y -direction, respectively.…”
Section: Resultsmentioning
confidence: 99%
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