2022
DOI: 10.1680/jemmr.22.00032
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Influence of dopants in the buffer layer on CZTS solar cell performance

Abstract: CZTS (Copper zinc Tin Sulphide) has commanded the next-generation solar-cell material because of its superior performance, lower cost, and abundant availability on the earth. This study examined the impact of different dopants in the buffer layer on the solar cells’ electrical characteristics. For the n-ITO/CdS (Ag-CdS, Cu-CdS, and Cl-CdS)/CZTS/ Mo proposed device structure of the solar cell, the doping concentration and thickness of the buffer and absorber layers were examined. Ag-CdS buffer layer was shown t… Show more

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Cited by 6 publications
(16 citation statements)
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“…36 The N D and thickness of the CZTS layer were adjusted from 1 μm to 5 μm and 10 16 cm À3 to 10 19 cm À3 , respectively. The results demonstrate that for carrier concentrations more than 10 17 cm À3 , the V oc was almost entirely distinct from the 1Â10 16 and 5Â10 18 cm À3 , the FF was nearly constant and was not affected by the absorber's thickness. When the carrier concentration for the absorber reached 4Â10 18 cm À3 , which is associated with the area where the device exhibits an acceptable efficiency, we saw that all PV performances of the device, including V oc , FF, and PCE, were rising.…”
Section: Collective Influence Of Thickness and Carrier Concentration ...mentioning
confidence: 82%
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“…36 The N D and thickness of the CZTS layer were adjusted from 1 μm to 5 μm and 10 16 cm À3 to 10 19 cm À3 , respectively. The results demonstrate that for carrier concentrations more than 10 17 cm À3 , the V oc was almost entirely distinct from the 1Â10 16 and 5Â10 18 cm À3 , the FF was nearly constant and was not affected by the absorber's thickness. When the carrier concentration for the absorber reached 4Â10 18 cm À3 , which is associated with the area where the device exhibits an acceptable efficiency, we saw that all PV performances of the device, including V oc , FF, and PCE, were rising.…”
Section: Collective Influence Of Thickness and Carrier Concentration ...mentioning
confidence: 82%
“…The increase in scattering and defects in the buffer layer with varying In 2 Se 3 thickness and donor density is responsible for the actions of J sc . 16 Furthermore, increased photon absorption in the thick In 2 Se 3 buffer layer reduces the absorption of light in the absorber layer, which may also impair the output parameters. In this study, the PCE is maximum at a thickness of 0.09 μm, but it is very complicated to fabricate such a thin layer, which is why the value is taken at 0.100 μm and the carrier concentration at 10 16 cm À3 .…”
Section: Modeling and Simulationmentioning
confidence: 99%
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