2002
DOI: 10.1039/b110611m
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Influence of electrochemical processing on the composition and microstructure of chemical-vapor deposited Ru and RuO2 nanocrystalline films

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Cited by 14 publications
(14 citation statements)
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“…In fact, positive‐ion surface spectra of the as‐grown CeO 2 /ZrO 2 /cordierite samples showed species related both to CeO 2 and to ZrO 2 single‐phase coatings (Ce + , CeH + , CeO x + (x = 1, 2), CeOH + , Zr + , ZrO x + (x = 0–2)), as well as to cordierite substrate (Mg + , Mg 2 O + , Si + , Si 2 + , Si 2 O + , Al + , Al 2 + , Al 2 O + , AlO + ). Moreover, as often observed for similar samples,19,20 signals coming from processing contamination were distinguished (Li + , CH x + (x = 0, 3), Na + , K + , Ca + , Cl + , CaO + ). Taking into account that surface XPS analysis for the same coatings did not detect the presence of ZrO 2 in ceria film before the annealing process, signals related to ZrO 2 or substrate distinguished by SIMS are a consequence of different sampling depth and enhanced sensitivity with respect to XPS 20,21…”
Section: Resultssupporting
confidence: 71%
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“…In fact, positive‐ion surface spectra of the as‐grown CeO 2 /ZrO 2 /cordierite samples showed species related both to CeO 2 and to ZrO 2 single‐phase coatings (Ce + , CeH + , CeO x + (x = 1, 2), CeOH + , Zr + , ZrO x + (x = 0–2)), as well as to cordierite substrate (Mg + , Mg 2 O + , Si + , Si 2 + , Si 2 O + , Al + , Al 2 + , Al 2 O + , AlO + ). Moreover, as often observed for similar samples,19,20 signals coming from processing contamination were distinguished (Li + , CH x + (x = 0, 3), Na + , K + , Ca + , Cl + , CaO + ). Taking into account that surface XPS analysis for the same coatings did not detect the presence of ZrO 2 in ceria film before the annealing process, signals related to ZrO 2 or substrate distinguished by SIMS are a consequence of different sampling depth and enhanced sensitivity with respect to XPS 20,21…”
Section: Resultssupporting
confidence: 71%
“…TiO x +/− , Ti 2 O x + ) appeared from the CeO 2 surface, although no Ti peaks were recorded by XPS, except for the 30CeZrTi‐annealed sample. As previously mentioned, this apparent discrepancy can be traced back to the higher SIMS sensitivity with respect to XPS 19. There was no evidence in the as‐grown samples of titania precursor fragments, suggesting a good conversion of Ti(O i Pr) 4 into TiO 2 .…”
Section: Resultsmentioning
confidence: 89%
“…This property is specifically important for RuO 2 applications in the form of aerogels [34]. Hydroxylation and hydration of Ru and RuO 2 films onto Ti electrodes were observed in electrochemical reactions [35]. Bhaskar et al [36] recorded the Raman spectra of RuO 2 thin films and RuO 2 powder and observed an unassigned band at 477 cm À 1 .…”
Section: Resultsmentioning
confidence: 97%
“…[40] The chemical compositions of the reactively sputtered RuO 2 films were analyzed using high-resolution X-ray photoelectron spectroscopy (XPS). [46] The absorption of water by a hygroscopic oxide such as RuO 2 is common, especially when it is exposed to the ambient. It was found that XPS spectra obtained for Ru 3d shift toward higher binding energy with increasing oxygen partial pressure, as shown in Figure S1 (Supporting Information).…”
Section: Introductionmentioning
confidence: 99%