2020
DOI: 10.1016/j.jnucmat.2019.151856
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Influence of fast neutron and gamma irradiation on the thermoelectric properties of n-type and p-type SiGe alloy

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Cited by 6 publications
(3 citation statements)
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“…In fact, the reduction of the concentration of point defects after annealing has also been reported previously [65,67]. A similar effect has also been observed for the neutron-irradiated SiGe [70]. In addition, it should be pointed out that the as-prepared Mg 3 Sb 2based samples also show similar restoration of electrical conductivity during the heat and cooling cycles of the measurements [71].…”
Section: Neutron Irradiationsupporting
confidence: 84%
“…In fact, the reduction of the concentration of point defects after annealing has also been reported previously [65,67]. A similar effect has also been observed for the neutron-irradiated SiGe [70]. In addition, it should be pointed out that the as-prepared Mg 3 Sb 2based samples also show similar restoration of electrical conductivity during the heat and cooling cycles of the measurements [71].…”
Section: Neutron Irradiationsupporting
confidence: 84%
“…Electron irradiations mostly determine an introduction of point radiation defects ( Table 2 ). It had been shown [ 19 ] that gamma irradiations of 10 kGy dose did not change significantly the conductivity of the SiGe material, while neutron irradiations sharply decreased material conductivity to 0.14% of non-irradiated material. As shown in [ 18 ], the same type of radiation defects in Si and SiGe alloys are introduced by hadron irradiations in the range of moderate energy and fluence.…”
Section: Recorded Characteristics and Extracted Parametersmentioning
confidence: 99%
“…The in-core irradiation effect on bulk thermoelectric materials like germanium telluride, silicon-germanium, etc. has been studied, [2][3][4][5][6] most under the comparatively low neutron uences of 10 13 to 10 19 n cm −2 . Neutron irradiation at relatively low temperatures (<200 C) created irradiation-induced point defects in these materials, reducing carrier mobility and lowering thermoelectric performance.…”
Section: Introductionmentioning
confidence: 99%