2013
DOI: 10.1016/j.jallcom.2012.11.091
|View full text |Cite
|
Sign up to set email alerts
|

Influence of field-annealing on the microstructure, magnetic and microwave properties of electrodeposited Co0.3Fe0.7 films

Help me understand this report

Search citation statements

Order By: Relevance

Paper Sections

Select...
1

Citation Types

0
2
0

Year Published

2013
2013
2023
2023

Publication Types

Select...
7

Relationship

0
7

Authors

Journals

citations
Cited by 12 publications
(2 citation statements)
references
References 15 publications
0
2
0
Order By: Relevance
“…As the development of communications and information technology, the continous demands for miniaturization and integration of transforms, inductors, and other communication electromagnetic equipment. In addition, with the frequency of Radio Frequency Integrated Circuits (RFICs) increased to gigahertz (GHz), the research of high-frequency magnetic materials has been greatly promoted [1][2][3]. At the same time, the miniaturization, high frequency and integration of inductors are the key to realize magnetic electronic products [4][5][6].…”
Section: Introductionmentioning
confidence: 99%
“…As the development of communications and information technology, the continous demands for miniaturization and integration of transforms, inductors, and other communication electromagnetic equipment. In addition, with the frequency of Radio Frequency Integrated Circuits (RFICs) increased to gigahertz (GHz), the research of high-frequency magnetic materials has been greatly promoted [1][2][3]. At the same time, the miniaturization, high frequency and integration of inductors are the key to realize magnetic electronic products [4][5][6].…”
Section: Introductionmentioning
confidence: 99%
“…As the film thickness expanded from 10 nm to 50 nm and the annealing temperature rose up to 300 • C, the crystalline size of the Co 40 Fe 40 Sm 20 thin films notably decreased.This reduction in size resulted in the diminishment of lattice spacing in the crystallographic planes, causing compressive stress within the thin films. Moreover, the decrease in crystalline size with the escalation of film thickness and annealing temperatures can be linked to a higher rate of nucleation[20,21]. The Scherrer-Debye equation stands as a fundamental tool within the realm of crystallography, serving the purpose of ascertaining the average size of crystal grains within a material.…”
mentioning
confidence: 99%