2016
DOI: 10.1016/j.polymer.2016.03.025
|View full text |Cite
|
Sign up to set email alerts
|

Influence of film thickness on the reorientation structure of photoalignable liquid crystalline polymer films

Help me understand this report

Search citation statements

Order By: Relevance

Paper Sections

Select...
1
1

Citation Types

0
3
0

Year Published

2017
2017
2024
2024

Publication Types

Select...
5

Relationship

0
5

Authors

Journals

citations
Cited by 5 publications
(3 citation statements)
references
References 19 publications
0
3
0
Order By: Relevance
“…The structure-property relationships of polymeric materials become more complex with decreasing material thickness due to the influence of the polymer-substrate and polymer-air interfaces when there is little bulk material, which usually occurs for thin films with thicknesses of less than 100 nm. [29] To date, a number of characterization techniques have been employed to study the molecular orientation in polymer thin films including Fourier transform infrared spectroscopy, [30,31] near edge X-ray absorption fine structure spectroscopy, [32,33] and variable angle spectroscopic ellipsometry (VASE). [34,35] VASE is a powerful technique that measures the change in the polarization of light interacting with the thin film sample in order to elucidate the anisotropic optical properties and thickness of a film and has enjoyed great success as a characterization technique for semiconductors, [36] liquid crystals, [37] and has emerged as a key analytical technique in polymer thin films.…”
Section: Introductionmentioning
confidence: 99%
“…The structure-property relationships of polymeric materials become more complex with decreasing material thickness due to the influence of the polymer-substrate and polymer-air interfaces when there is little bulk material, which usually occurs for thin films with thicknesses of less than 100 nm. [29] To date, a number of characterization techniques have been employed to study the molecular orientation in polymer thin films including Fourier transform infrared spectroscopy, [30,31] near edge X-ray absorption fine structure spectroscopy, [32,33] and variable angle spectroscopic ellipsometry (VASE). [34,35] VASE is a powerful technique that measures the change in the polarization of light interacting with the thin film sample in order to elucidate the anisotropic optical properties and thickness of a film and has enjoyed great success as a characterization technique for semiconductors, [36] liquid crystals, [37] and has emerged as a key analytical technique in polymer thin films.…”
Section: Introductionmentioning
confidence: 99%
“…After thermal annealing, their UV-vis absorption and CD signals were decreased (Figure 3b), probably due to the partial conversion of in-plane orientation to out-of-plane orientation of mesogenic units during the thermal annealing process. [23] Because of the small doping amount of PTZ, its absorption and induced Cotton effect peaks were not detected at 425 nm. It should be noticed that R-PB2 had a positive CD signal at 626 nm from the selective reflection of chiral nematic LC.…”
Section: Resultsmentioning
confidence: 99%
“…The Supporting Information is available free of charge on the ACS Publications website at DOI: 10.1021/acs.langmuir.7b00417. The writing dynamics of the photoalignment films with different thickness (Figure S1); ordering comparison of the photoalignment films induced by 1 J/cm 2 and 3 J/cm 2 365 nm LPUV at different relative humidities (Figure S2); film alignment before and after LPUV excitation with increasing humidity from 20%RH to 80%RH (Figure S3); aligned SD1 observed under depolarized optical microscope (Figure S4) (PDF) …”
mentioning
confidence: 99%