2002
DOI: 10.1016/s0168-583x(01)00875-8
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Influence of fluorine on the simulation of the transient enhanced diffusion of 15 keV BF2+ ion implantation into silicon

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Cited by 7 publications
(8 citation statements)
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“…3. Alternatively, the co-location of the fluorine and boron in the SiGe layer could suggest a chemical interaction between fluorine and boron as has been proposed for fluorine and boron in silicon [13], [16], [23]. If the fluorine-boron interaction in SiGe was stronger than that seen in Si, this might also explain the accumulation of fluorine in the SiGe layer.…”
Section: Resultsmentioning
confidence: 95%
“…3. Alternatively, the co-location of the fluorine and boron in the SiGe layer could suggest a chemical interaction between fluorine and boron as has been proposed for fluorine and boron in silicon [13], [16], [23]. If the fluorine-boron interaction in SiGe was stronger than that seen in Si, this might also explain the accumulation of fluorine in the SiGe layer.…”
Section: Resultsmentioning
confidence: 95%
“…As discussed in the introduction, several alternative mechanisms have been proposed to explain the effect of fluorine in suppressing the transient enhanced diffusion of boron, including a chemical interaction between boron and fluorine, 4,9,11,14,16 the presence of vacancy-fluorine cluster 13,17,18,25 and the interaction of fluorine with interstitials. 2,4-10, 18 The possibility of a chemical interaction between boron and fluorine can be discounted, since the shallow fluorine peak is seen whether or not a boron marker layer is present, as shown in Figs.…”
Section: Discussionmentioning
confidence: 99%
“…[1][2][3][4][5][6][7][8][9][10][11][12][13][14][15][16][17][18] This research has been motivated by the requirement in advanced CMOS technologies to minimize boron diffusion for the formation of shallow source/drain junctions and sharply defined halo profiles. 19,20 The minimization of boron diffusion is also important in bipolar transistors, where boron diffusion limits the achievable base width and hence the value of cutoff frequency that can be obtained.…”
Section: Introductionmentioning
confidence: 99%
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