Using X-ray diffraction, UV-Visible spectroscopy, XPS and photoluminescence (PL) measurements, the structural, optical and electronic properties of ZnO and Cedoped ZnO thin films were investigated; the films were deposited on glass substrates by RF reactive-magnetron sputtering and post-annealed at 300 C in an oxygen atmosphere. Under similar deposition conditions, both films crystallized into hexagonal würzite lattice structures. The pure ZnO film exhibited a c-axis preferential orientation, whereas the Cedoped exhibited an a-axis preferential orientation. The films display uniform textured surfaces with columnar-like microstructures. The UV-Vis spectra showed high transparencies of 90 % on average for both films. Band gaps of E g ¼ 3:23 eV and E g ¼ 3:27 eV for pure and Ce-doped film, respectively, were measured. The doped film spectrum was shifted to the blue as a result of the Burstein-Moss effect. The XPS spectra show that the VB edge of the doped film shifts toward lower binding energy, at $ 1.3 eV below E F , while the VB edge of the pure film is located at $ 2.0 eV below E F . Additionally, Ce 3þ and Ce 4þ ions coexist in the ZnO matrix in fractions of $ 70 and $ 30 %, respectively. The PL spectra show that both types of ions induce extra electron states that allow multiple emission peaks in the blue-green region.