2015
DOI: 10.1155/2015/686021
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Influence of OHIon Concentration on the Surface Morphology of ZnO-SiO2Nanostructure

Abstract: The influence of varying OH− ion concentration on the surface morphology of chemically deposited ZnO-SiO 2 nanostructures on glass substrate was investigated. The morphological features, phase structure, and infrared characteristics were examined by scanning electron microscopy (SEM), X-ray diffraction (XRD), and Fourier transform infrared spectroscopy (FTIR), respectively. Results revealed that silica significantly changes the hexagonal morphology of bare ZnO rod to "pointed tips" when using low initial OH − … Show more

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Cited by 23 publications
(11 citation statements)
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“…In addition, diffraction patterns have two peaks at 25° and 45°, possibly attributed to the characteristics of reduced graphite oxide (rGO) . Furthermore, the broadband at 25° was associated with the amorphous phase of SiO 2 , as reported by Ven et al, as expected in this work.…”
Section: Resultssupporting
confidence: 86%
“…In addition, diffraction patterns have two peaks at 25° and 45°, possibly attributed to the characteristics of reduced graphite oxide (rGO) . Furthermore, the broadband at 25° was associated with the amorphous phase of SiO 2 , as reported by Ven et al, as expected in this work.…”
Section: Resultssupporting
confidence: 86%
“…In general, the absence of peaks of likely impurities such as sodium sulfate and other salts or www.nature.com/scientificreports/ metals confirms the purity of recovered products 42,43 . The peak between 17° and 30° recorded in the precipitate from pH 10 to pH 6 indicates amorphous silica according to Liu et al and Tinio et al 44,45 . Together with the featureless diffractograms, the appearance of a diffuse maximum at 22.5° indicates the amorphous nature of silica existing in the recovered precipitates in this range of pH 46,47 .…”
Section: Clarification Of Chemical Structure Ft-ir Analysismentioning
confidence: 83%
“…The X-ray diffraction (XRD) measurements are presented in Figure 1 . An analysis of the results shows that the sample SiO 2 -Ag has a characteristic peak of amorphous SiO 2 at around 2 θ = 22.2° [ 78 , 79 , 80 , 81 ]. No additional peak is observed regarding possible Ag phases.…”
Section: Resultsmentioning
confidence: 99%