2019
DOI: 10.1109/tcpmt.2019.2894970
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Influence of Packaging Processes and Temperature on Characteristics of Schottky Diodes Made of SiC

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Cited by 12 publications
(4 citation statements)
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“…As to junction temperature, silicon IGBT devices have a limit of 150 • C for 6 kV voltage, whereas wide bandgap semiconductors such as SiC and GaN can work at higher temperatures. Considering structural components, welding materials, reliability and cost, the junction temperature is limited to 175 • C by available packaging technology [9,10]. In medium and high-power applications, traditional silicon IGBTs with low switching frequency and new SiC MOSFETs with high cost present performance and cost problems.…”
Section: Introductionmentioning
confidence: 99%
“…As to junction temperature, silicon IGBT devices have a limit of 150 • C for 6 kV voltage, whereas wide bandgap semiconductors such as SiC and GaN can work at higher temperatures. Considering structural components, welding materials, reliability and cost, the junction temperature is limited to 175 • C by available packaging technology [9,10]. In medium and high-power applications, traditional silicon IGBTs with low switching frequency and new SiC MOSFETs with high cost present performance and cost problems.…”
Section: Introductionmentioning
confidence: 99%
“…Previous studies have proved the influence of the assembly process, and the thermal pad dimension of Schottky diodes' die on the thermal resistance of the diodes [13,18]. The influence of the soldering method, related to the void ratio in the solder joint, on the thermal resistance of the power LED was also investigated [15].…”
Section: Introductionmentioning
confidence: 99%
“…Unfortunately, at present this is only a theoretical possibility, because so far no one has introduced to industrial production any high-temperature cases dedicated to the considered class of devices. Yet, this would make possible operation of these devices at very high values of their internal temperature (Kisiel and Myśliwiec, 2017; Yildirim et al , 2010; Abay et al , 2003; Cinar et al , 2009; Sheng, 2009; Buttay et al , 2011; Górecki et al , 2019; Bisewski et al , 2016; Górecki et al , 2019a). Investigations devoted to construct such cases were described among others in the papers (Górecki et al , 2019; Górecki et al , 2019a; Bisewski et al , 2016).…”
Section: Introductionmentioning
confidence: 99%