2018
DOI: 10.1088/1361-6641/aab6c3
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Influence of photo-generated carriers on current spreading in double diode structures for electroluminescent cooling

Abstract: Current crowding close to electrical contacts is a common challenge in all optoelectronic devices containing thin current spreading layers (CSLs). We analyze the effects of current spreading on the operation of the so-called double diode structure (DDS), consisting of a light emitting diode (LED) and a photodiode (PD) fabricated within the same epitaxial growth process, and providing an attractive platform for studying electroluminescent (EL) cooling under high bias conditions. We show that current spreading i… Show more

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Cited by 13 publications
(21 citation statements)
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“…2(c). 14,15 The shoulder of the LED's J -V curve observed from experimental data is fully reproducible with the EC in Fig. 2(c).…”
supporting
confidence: 74%
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“…2(c). 14,15 The shoulder of the LED's J -V curve observed from experimental data is fully reproducible with the EC in Fig. 2(c).…”
supporting
confidence: 74%
“…The g CQE ¼ 0.70 reported here exceeds the CQE records (g CQE ¼ 0.63) we have reported previously 14,15 and also slightly exceeds the highest EQE g EQE ¼ 0.68 reported for GaAs based LEDs in the literature. 3 While directly comparing the EQE of established GaAs LEDs and our devices' CQE is not straightforward, we nevertheless point out that they both provide a lower limit for the IQE; thus, our result increases the directly measured lower bound for the IQE of GaAs based LEDs.…”
supporting
confidence: 57%
“…In this paper, we generalize and summarize our previous results 4,5,13,14 on analyzing the performance of the DDS from the point of view of high-power EL cooling. Additionally, here we separately analyze the LED itself…”
Section: Introductionmentioning
confidence: 73%
“…The contact to the GaAs was made through openings in the silicon nitride layer and varied from 5 to 100 % of the top LED area. 5 A three point scheme with a common grounded cathode for the LED and PD was used for the analysis of the electrical characteristics of the DDS. The used setup allows biasing the LED with a voltage U 1 and the simultaneous measurement of both the LED current I 1 and PD current I 2 , while the PD is under a short circuit condition.…”
Section: Experimental Methodsmentioning
confidence: 99%
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