1999
DOI: 10.1007/s002160051170
|View full text |Cite
|
Sign up to set email alerts
|

Influence of relative humidity in sensing halogenated hydrocarbons with Reflectometric Interference Spectroscopy (RIfS)

Help me understand this report

Search citation statements

Order By: Relevance

Paper Sections

Select...
1

Citation Types

0
1
0

Year Published

2000
2000
2015
2015

Publication Types

Select...
4
2

Relationship

0
6

Authors

Journals

citations
Cited by 7 publications
(1 citation statement)
references
References 0 publications
0
1
0
Order By: Relevance
“…[112][113][114][115] It is used for measurements in the gas phase, the detection of herbicides in water, for antigen-antibody binding assays, for separation of chiral substances, and even for detection of cell adhesion. [116][117][118][119][120] In our study, a silicon wafer with an oxide layer of 5 µm thickness is used as a substrate for vesicle spreading and covalent binding of molecules. The thickness of adsorbed layers with a refractive index of n i can be determined by detecting the reflectivity of the surface and by calculating optical thickness OT values while accounting for the Fresnel coefficients given by and the following relation: 43…”
Section: Principlementioning
confidence: 99%
“…[112][113][114][115] It is used for measurements in the gas phase, the detection of herbicides in water, for antigen-antibody binding assays, for separation of chiral substances, and even for detection of cell adhesion. [116][117][118][119][120] In our study, a silicon wafer with an oxide layer of 5 µm thickness is used as a substrate for vesicle spreading and covalent binding of molecules. The thickness of adsorbed layers with a refractive index of n i can be determined by detecting the reflectivity of the surface and by calculating optical thickness OT values while accounting for the Fresnel coefficients given by and the following relation: 43…”
Section: Principlementioning
confidence: 99%