2022
DOI: 10.1016/j.jmmm.2021.168674
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Influence of seed layer on the magnetoresistance properties in IrMn-based magnetic tunnel junctions

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Cited by 5 publications
(4 citation statements)
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“…[TaN] shows the most significant increase, but still suitable for MgO-MTJ growth. In addition, MTJ buffers are also required to have a low resistivity [39] for compatibility with the patterning process and high TMR ratio [40]. The overall lower H ex , H c and T b values obtained with [TaN], are most likely due to its larger surface roughness.…”
Section: Effect Of Buffer Layers On Mnir/cofe Bilayersmentioning
confidence: 99%
“…[TaN] shows the most significant increase, but still suitable for MgO-MTJ growth. In addition, MTJ buffers are also required to have a low resistivity [39] for compatibility with the patterning process and high TMR ratio [40]. The overall lower H ex , H c and T b values obtained with [TaN], are most likely due to its larger surface roughness.…”
Section: Effect Of Buffer Layers On Mnir/cofe Bilayersmentioning
confidence: 99%
“…Introducing a third element is one viable approach to improving the thermal stability of CoFe alloys [14]. CoFe thin films find widespread applications in magnetic materials and magnetic storage systems [15,16]. However, the addition of Sm elements may further enhance their performance, including improvements in magnetic and structural properties [17][18][19][20].…”
Section: Introductionmentioning
confidence: 99%
“…NiFe/IrMn is one of the exchange biased systems widely applied in planar Hall sensors [30,31], magnetic tunnel junction devices [32,33], microwave integrated circuits [34,35], strain sensors [36], flexible and shapeable electronics [37,38]. The interfacial spin configuration of the AF layers is very sensitive to structural defects, that facilitates bending strain tailored exchange bias [39,40], successfully implemented in wrinkled NiFe/IrMn thin films [37], grown on flexible substrates.…”
Section: Introductionmentioning
confidence: 99%