2010
DOI: 10.1063/1.3385781
|View full text |Cite
|
Sign up to set email alerts
|

Influence of Sn Migration on phase transition in GeTe and Ge2Se3 thin films

Abstract: Phase transitions in GeTe/SnSe and Ge2Se3/SnTe are investigated using time resolved x-ray diffraction. GeTe exhibits a structural transition from rhombohedral to the cubic phase at 300 °C, which is ∼100 °C lower than that of pure GeTe. This is facilitated by incorporation of Sn from SnSe. Sn migration is observed explicitly in Ge2Se3/SnTe by separation of SnSe phase. Amorphous Ge2Se3 is also found to crystallize at a lower temperature of 300 °C resulting in orthorhombic GeSe and monoclinic GeSe2. Thus, inclusi… Show more

Help me understand this report

Search citation statements

Order By: Relevance

Paper Sections

Select...
4
1

Citation Types

2
12
0
1

Year Published

2011
2011
2021
2021

Publication Types

Select...
8
2

Relationship

3
7

Authors

Journals

citations
Cited by 21 publications
(15 citation statements)
references
References 18 publications
2
12
0
1
Order By: Relevance
“…14, metal ions of the same polarity from the M-Se layer are incorporated into the active layer, along with Ag þ from the Ag layer. This was previously shown using devices comprising only Ge 2 Se 3 /SnSe layers and no Ag [123] and in stacked thin films [149], [150].…”
Section: B Layered Chalcogenide Devicesmentioning
confidence: 69%
“…14, metal ions of the same polarity from the M-Se layer are incorporated into the active layer, along with Ag þ from the Ag layer. This was previously shown using devices comprising only Ge 2 Se 3 /SnSe layers and no Ag [123] and in stacked thin films [149], [150].…”
Section: B Layered Chalcogenide Devicesmentioning
confidence: 69%
“…However, several alternate chalcogenide compositions are being explored in an attempt to ascertain new materials with superior performance as well as for developing next generation of non-volatile memories. The nanosecond switching in GeTe alloy films in confined geometry together with high resistance change upon crystallization and the non-volatile retention of data is very promising for its device applications [4]. It has been reported by high resolution X-ray photoelectron spectroscopy that the structural environment of Ge atom changes during phase transition and not its chemical environment [5].…”
Section: Introductionmentioning
confidence: 99%
“…This device is comprised of chalcogenide material layers (Figure 1) (Campbell, 2008a,b, 2017). It uses a Ge 2 Se 3 chalcogenide layer, which is activated for analog resistance tuning operation by Sn ions that migrate from an adjacent SnSe layer during the initial forming process (Campbell and Anderson, 2007; Devasia et al, 2010, 2012). A layer of ternary GeSeAg is the ion source during operation.…”
Section: Introductionmentioning
confidence: 99%