2006
DOI: 10.1016/j.jmmm.2006.02.201
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Influence of spacer layer in exchange coupled NiFe/Cu/IrMn trilayer structure

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Cited by 15 publications
(5 citation statements)
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“…For the lower thickness t Cu < 0.5 nm, the optical mode of the FMR has only one maximum at 180 • . However, with the further increase in t Cu to the thickness t Cu > 0.5 nm, the angular dependence of resonant field has two maxima at 90 • and 270 • , that is similar to the angular dependence of FMR resonant field for a single NiFe thin film [32].…”
Section: High-frequency Magnetization Dynamics and Fmrsupporting
confidence: 57%
See 1 more Smart Citation
“…For the lower thickness t Cu < 0.5 nm, the optical mode of the FMR has only one maximum at 180 • . However, with the further increase in t Cu to the thickness t Cu > 0.5 nm, the angular dependence of resonant field has two maxima at 90 • and 270 • , that is similar to the angular dependence of FMR resonant field for a single NiFe thin film [32].…”
Section: High-frequency Magnetization Dynamics and Fmrsupporting
confidence: 57%
“…However, unavoidable stochasticity of the initial stages of the spacer layer deposition results in relatively large scattering of the exchange bias values regardless technique applied for the sample deposition [21,23,28]. With increase in thickness of spacer layer, several types of exchange bias have been observed: exponential decay [11,23,[28][29][30][31][32], non-monotonic, with enhancement of exchange bias at sub-nanometer spacer thicknesses [23,24], decay with saturation [9,33,34], and oscillating behavior [35]. Understanding the mechanisms of exchange bias variations related to structural modifications of the FM/AFM interface accompanied by the addition of a non-magnetic spacer is of importance to adjust the exchange bias by spacer thickness more predictably and less affected by structural modifications associated with sample-to-sample fluctuations of fabrication conditions.…”
Section: Introductionmentioning
confidence: 99%
“…Thus, the H ex can be well-tuned in FM/NM/AF trilayer sensor structures by varying the thickness of the NM spacer layer. The exchange bias decreases exponentially with the increase of the spacer layer thickness and vanishes around 1 nm thickness while this thickness is enough to completely separate the FM/AF layers [65,93,[157][158][159][160][161]. In the literature, mostly the Cu material has been used as a spacer layer.…”
Section: Trilayersmentioning
confidence: 99%
“…With increase of t Spacer from 0.3 nm to 0.7 nm the operating field range reduces almost 3 times, while the change of amplitude of PHE signal is less than 2 percent. The dependence of oper ating field range on Cu thickness (figure S2 in the supplemen tary material) has been approximated [33,43], as:…”
Section: Reduction Of Power Consumption By Thickness Variation Of Non...mentioning
confidence: 99%