Influence of Structural Defects in Epitaxial Ferrite-Garnet Films on their Magnetic Properties

Abstract

The study of defects observed in substrates with gadolinium gallium garnet (GGG) with orientations (110), (100) and (111) and in epitaxial films grown of iron-yttrium garnet (YIG) were investigation. It is shown that the line width ferromagnetic resonance strongly depends on the presence of defects in YIG films. It was established that the highest quality and minimal magnetic losses have YIG films with a thickness of 2...8 mm grown on GGG defect-free substrates with orientation (111), which were grinding and polishing the surface to 14 grade purity.

Crystalline, magnetic and domain structure of epitaxial ferritegarnet films (review)

“…It has been shown in [24] that for the growth of a defect-free films, the allowance values of Δa at room temperature should be in the range from -0.012 ÷ -0.015 Å to +0.018 Å. The discrepancy between the parameters of the film and substrate lattice leads to the occurrence of dislocations of discrepancies and mechanical stresses that negatively affects to the characteristics of the ferritegarnet film [27]. The choice of crystallographic orientation of the substrate surface is quite important.…”