2015
DOI: 10.1016/j.tsf.2015.04.024
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Influence of substrate material on the microstructure and optical properties of hot wall deposited SnS thin films

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Cited by 14 publications
(9 citation statements)
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“…is also a little lower than experimental data 5.5 [1]. During third-order Birch-Murnaghan equation fitting, ′ 0 B and B 0 are related to one another.…”
Section: Structural Propertiesmentioning
confidence: 58%
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“…is also a little lower than experimental data 5.5 [1]. During third-order Birch-Murnaghan equation fitting, ′ 0 B and B 0 are related to one another.…”
Section: Structural Propertiesmentioning
confidence: 58%
“…IV-VI semiconductor compounds have attracted more and more interest in recent years owing to their visible advantages of earth abundance, no toxicity, and high optical absorption [1][2][3][4][5][6][7]. Tin sulfide SnS, as a representative, has been widely used as thin film polarizers, photovoltaic cells, laser materials, sensors, thermoelectric cooling materials, and so on [1,[7][8][9][10].…”
Section: Introductionmentioning
confidence: 99%
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“…Tin disulfide, first synthesized about 200 years ago [1] , has been applied to various optoelectronic devices and solar collectors [2][3][4][5][6][7][8][9][10][11] . From the experimental perspective, it is a layered semiconductor with a CdI 2 -type structure in which the two close-packed sheets of sulfur atoms sandwich the sheets of tin atoms [12] .…”
Section: Introductionmentioning
confidence: 99%