Influence of Technological Factors on Sensitivity of Analytical Devices Based on Surface Plasmon Resonance

Dorozinsky, Glib; Doroshenko, T.; Maslov, V. P.

doi:10.4236/jst.2015.52006

Cited by 11 publications

(5 citation statements)

References 6 publications

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“…The obtained results were confirmed by the authors of the work [26]. Implementation of this new technology for preparation of the SE metal layer not only decreased the absolute error of measuring the analyte RI but, in addition, increased the sensitivity due to growing the steepness of SPR curve slopes and ordering the structure of SE surface [27,28].…”

Section: Influence Of Technology Of Sensor Elementmentioning

confidence: 55%

Current Trends in Technology and Materials of Sensors Based on Surface Plasmon Resonance

2018

AMSE

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Considered in this review are main directions of developing technology and construction of the available sensors based on surface plasmon resonance phenomenon to increase their sensitivity and accuracy of measurements. It has been shown that reducing roughness of the plasmon carrying layer in the sensor as well as application of an additional covering dielectric layer with developed surface enables two-fold increase in the sensitivity due to the twice increased surface of interaction between the sensor and studied substance. The main technical way enabling to diminish surface roughness is thermal annealing, and the best result is usually reached for the annealing temperature 120 °С. In most cases, as a dielectric layer they use metal oxides Al2 O3 , TiO2 , SiOx and ZnO, which allows attaining the detection limit in changes of the studied substance refraction index close to 1 • 10–9, what is one order better than that in available commercial analytic devices based on SPR phenomenon. Shown in the review are promising directions for development of SPR sensorics such as application of multilayer graphene coatings and polymer layers prepared by polymerization in high-frequency plasma of inert gas. Also, adduced in the paper are statistical data that show the number of publications in scientific journals within this topic. This number underwent an exponential growth and to the end of 2015 was about six thousands, which is indicative of these investigations topicality and stimulates further studying the possibilities to improve and develop new analytical devices based on the SPR principle. In our opinion, further development of these sensors will be directed to increasing the selectivity, wear resistance of the sensitive element surface as well as to developing the methods for regeneration of receptors suitable for multiple using the sensitive elements.

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Section: Influence Of Technology Of Sensor Elementmentioning

confidence: 55%

Current Trends in Technology and Materials of Sensors Based on Surface Plasmon Resonance

2018

AMSE

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“…This devices provides measurements of the total SPR curve in the angle configuration that corresponds to the Kretchmann optical geometry with mechanical scanning the angle of incidence within the range 17 degrees in air (12 degrees in glass) and accuracy 5 arc seconds as well as the possibility to make absolute calibration by the angle. Excitation of [14].…”

Section: Surface Plasmon Resonance Devicesmentioning

confidence: 99%

Influence of Temperature on the Measuring Accuracy of Devices Based on Surface Plasmon Resonance Phenomenon

Dorozinska¹,

Turu²,

Маркіна³

et al. 2018

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The main reasons for the occurrence of temperature error and perspective directions of decreasing of its value are presented by improving the device design based on the phenomenon of surface plasmon resonance (SPR) and numerical methods of processing the results of measurements by this device. The most essential influence on changes in results of measurements can be rendered by temperature changes in the analyte refractive index. It is shown that the application of the integrated temperature stabilization of the device with the test substance, and numerical processing of the measurement results for compensation of temperature changes of the test substance and the use of film heaters it is possible to reduce the measurement error of the refractive index of the analyte at least 30 times from 2.4 × 10 −4 to 7.6 × 10 −6.

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“…To reduce the absolute error in the analyte refraction index and enhance the sensitivity, it is necessary to lower roughness of the metal layer surface in the sensitive element. For example, lowering the mean-square surface roughness from 2 down to 0.8 nm, when depositing the metal layer under the angle 45° to the glass substrate causes 1.5 times increase in the sensor sensitivity in the analysis of liquid substances and 2 times in analyses of gas-like substances [3]. The main factor influencing on the structure and properties as well as on nanoroughness of metal layers prepared using thermal evaporation in vacuum is effect of the substrate nanorelief.…”

Section: Introductionmentioning

confidence: 99%

Effect of electron-beam treatment of sensor glass substrates for SPR devices on their metrological characteristics

Ващенко¹

2019

Semicond. phys. quantum electr. optoelectron

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Electron-beam treatment the glass substrates for sensitive elements of SPR devices causes almost twofold narrowing their refractometric characteristics from 0.867 down to 0.453 deg. The angular shift was also changed, which made the measuring range wider by 0.37 deg. The sensitivity of SPR devices increased by 1.7 times from 1.425 up to 2.396 deg-1 as a consequence of lowering the energy expenses during propagation of surface plasmons along the boundary "metal-air". The reason for this lowering is related to higher surface uniformity of the gold metal film, its higher density as well as lower nanoroughness of the glass surface and the thickness of heterointerface "gold-air". In this case, the dispersion value for unevenness heights on the surface relatively to the base line was lowered from ±18 down to ±5 nm, mean-square roughness was threefold reduced from 4.67 down to 1.64 nm, and the thickness of heterointerface gold-air was lowered from 3.26 down to 1.37 nm. It was ascertained using X-ray reflectometry that the film density increased from 17.2 up to 19.3 g/cm 3 and reached the value typical for the bulk gold. It provided the changes in the refraction index and extinction coefficient of the gold film, which was ascertained using the ellipsometric method. Thus, the performed analysis of refractometric characteristics showed that electron-beam treatment the glass substrates of sensitive elements for SPR devices is able to efficiently enhance their sensitivity and to widen the range of measured resonance SPR angles.

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Influence of Technological Factors on Sensitivity of Analytical Devices Based on Surface Plasmon Resonance

Cited by 11 publications

References 6 publications

Current Trends in Technology and Materials of Sensors Based on Surface Plasmon Resonance

Current Trends in Technology and Materials of Sensors Based on Surface Plasmon Resonance

Influence of Temperature on the Measuring Accuracy of Devices Based on Surface Plasmon Resonance Phenomenon

Effect of electron-beam treatment of sensor glass substrates for SPR devices on their metrological characteristics

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