2017
DOI: 10.1038/s41598-017-04884-2
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Influence of tensile-strain-induced oxygen deficiency on metal-insulator transitions in NdNiO3−δ epitaxial thin films

Abstract: We report direct evidence that oxygen vacancies affect the structural and electrical parameters in tensile-strained NdNiO3−δ epitaxial thin films by elaborately adjusting the amount of oxygen deficiency (δ) with changing growth temperature T D. The modulation in tensile strain and T D tended to increase oxygen deficiency (δ) in NdNiO3−δ thin films; this process relieves tensile strain of the thin film by oxygen vacancy incorporation. The oxygen deficiency is directly correlated with unit-cell volume and the me… Show more

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Cited by 43 publications
(26 citation statements)
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“…The in‐plane lattice parameters of LSMO thin films (aLSMOfilm) can be estimated by cLSMOfilm=false(1+νfalse)aLSMObulk2νaLSMOfilm1ν, where cLSMOfilm is the out‐of‐plane lattice parameter extracted from the X‐ray diffraction (XRD) patterns and ν (≈0.3) is the Poisson's ratio of LSMO. [ 33,34 ] The aLSMOfilm is 3.955, 3.896, 3.873, and 3.867 Å on the DSO, STO, LSAT, and LSAO substrates, respectively, indicating that LSMO is partially relaxed.…”
Section: Figurementioning
confidence: 99%
“…The in‐plane lattice parameters of LSMO thin films (aLSMOfilm) can be estimated by cLSMOfilm=false(1+νfalse)aLSMObulk2νaLSMOfilm1ν, where cLSMOfilm is the out‐of‐plane lattice parameter extracted from the X‐ray diffraction (XRD) patterns and ν (≈0.3) is the Poisson's ratio of LSMO. [ 33,34 ] The aLSMOfilm is 3.955, 3.896, 3.873, and 3.867 Å on the DSO, STO, LSAT, and LSAO substrates, respectively, indicating that LSMO is partially relaxed.…”
Section: Figurementioning
confidence: 99%
“…As shown in FIGURE 1B, the c-lattice constants as a function of stoichiometry can be nicely fitted with the Gaussian function shown below: No.4 sample was also grown to further prove the validity of this method and the result was consistent. It should be noted that other factors such as anion concentration also affects the lattice [44], which could explains the slight changes of exact OOP lattice constants of our films. Then, a series of NdNiO3 films were grown using the calibration process mentioned above.…”
Section: Resultsmentioning
confidence: 88%
“…4 sample was also grown to further prove the validity of this method and the result was consistent. It should be noted that other factors such as anion concentration also affects the lattice [42], which could explain the slight changes in exact OOP lattice constants of our films.…”
Section: Effect Of Cation Stoichiometry On Ndnio 3 Filmsmentioning
confidence: 88%
“…[63] The formation of O-vacancy defects will cause an increase in lattice-strain. [64,65] Apart from these types of surface defects, other lattice defects, for example, lattice dislocations, expansion, and distortion, may also change their physicochemical properties. [66] Therefore, the lattice strain, the oxygen defect, lattice deformation are strongly coupled with each other.…”
Section: Defect Chemistry Of Bifunctional Electrocatalystmentioning
confidence: 99%