2006
DOI: 10.1016/j.vacuum.2006.03.005
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Influences of carbon content and power density on the uniformity of PECVD grown a-Si1−x:Cx:H thin films

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Cited by 5 publications
(1 citation statement)
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“…Among the popular technique being used are Plasma Enhanced CVD [4][5][6], ECR-Plasma enhanced CVD [7], Sputtering [8] and also HW-CVD [9][10][11]. The present study investigates optical and structural properties of aSiC:H films prepared at various methane to silane gas flow rate ratio using a HW-CVD system.…”
Section: Introductionmentioning
confidence: 99%
“…Among the popular technique being used are Plasma Enhanced CVD [4][5][6], ECR-Plasma enhanced CVD [7], Sputtering [8] and also HW-CVD [9][10][11]. The present study investigates optical and structural properties of aSiC:H films prepared at various methane to silane gas flow rate ratio using a HW-CVD system.…”
Section: Introductionmentioning
confidence: 99%