1998 IEEE International Reliability Physics Symposium Proceedings 36th Annual (Cat No 98CH36173) RELPHY-98 1998
DOI: 10.1109/relphy.1998.670559
|View full text |Cite
|
Sign up to set email alerts
|

Influences of fan-in/fan-out structure and underfill fillet on TCT reliability of flip chip BGA

Help me understand this report

Search citation statements

Order By: Relevance

Paper Sections

Select...

Citation Types

0
0
0

Year Published

2001
2001
2010
2010

Publication Types

Select...
2
1

Relationship

0
3

Authors

Journals

citations
Cited by 3 publications
references
References 1 publication
0
0
0
Order By: Relevance