2001
DOI: 10.1016/s0026-2714(01)00041-5
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Study of the self-alignment of no-flow underfill for micro-BGA assembly

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Cited by 16 publications
(4 citation statements)
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“…Compared to the conventional solder self-alignment of micro-BGA (Ball Grid Array, BGA), where the allowed initial bias is known to be around 50% of the size of one pad [34], the proposed technique enables self-alignment at much larger initial misalignments.…”
Section: Influence Of the Gap With Biases In One Axismentioning
confidence: 99%
“…Compared to the conventional solder self-alignment of micro-BGA (Ball Grid Array, BGA), where the allowed initial bias is known to be around 50% of the size of one pad [34], the proposed technique enables self-alignment at much larger initial misalignments.…”
Section: Influence Of the Gap With Biases In One Axismentioning
confidence: 99%
“…Consequently the automated rework process and requirements for automation have also changed. The use of area array or advanced packaging SMCs is expected to increase (Lau and Alto, 1997;Bird, 1999;Chan et al, 2001;Yunus et al, 2003). Increasing adoption of lead free solders has also resulting in higher reflow temperatures.…”
Section: Introductionmentioning
confidence: 99%
“…Base on this trend, the use of two-dimensional (2D) surface-mount device (SMD) packages such as the ball grid array (BGA), chip scale package (CSP), wafer level package (WLP) and multi-chip module (MCM) has increased [1][2][3]. However, the 2D package technique has limitations for next-generation packaging trends because of interconnect scaling problems [4].…”
Section: Introductionmentioning
confidence: 99%