Influences of substrates and substrate temperatures on characteristics of epitaxial La0.5Sr0.5CoO3 thin films

Effects of substrates on the structure and dielectric properties of Ba(Sn0.15Ti0.85)O3 thin films

“…Similar results have been reported by other researchers for other ferroelectric thin films [14,15]. This was attributed to the different interaction strength between the substrates and the deposited atoms, and the different lattice mismatch between the substrates and BTS thin films, which directly influences the nucleation and growth dynamics [16]. It is likely that the LNO layer provides nucleation sites for the formation of the BTS grains, thus decreasing the nucleation energy for the perovskite phase.…”

Alkoxide route to La0.5Sr0.5CoO3 epitaxial thin films on SrTiO3

“…The composition with x = 0.5 has a slight rhombohedral distortion of the perovskite structure [5][6][7], and a low resistivity at room temperature, with reports of down to ca 100-300 μΩcm for bulk materials [5][6][7][8][9][10] and films [10][11][12][13]. It is therefore of great interest as a ceramic electrode or buffer layer for perovskitebased memories, sensors and actuators with good bonding properties and low fatigue [14] and hence plentiful studies have been made on preparation of LSCO films, especially with highvacuum physical techniques [10][11][12][13][15][16][17][18][19][20]. Sol-gel processing offers a cost effective and versatile route to complexcomposition thin films and is comparatively less demanding on the substrate size and shape than most other techniques.…”

Effects of buffer layers on the orientation and dielectric properties of Ba(Zr0.20Ti0.80)O3 thin films prepared by sol–gel method

“…The grain sizes of the BZT thin films deposited on Pt(were about 24, 28 and 19 nm, respectively. This difference in grain size was attributed to the different interaction strengths between the substrates and the deposited atoms, and the different lattice mismatches between the substrates and BZT thin films, which directly influences the nucleation and growth dynamics[18]. This behavior suggested that the LNO and CeO 2 XRD patterns of BZT thin films deposited on different substrates:…”