2004
DOI: 10.1021/jp0471305
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Infrared Ellipsometry of Self-Assembled Octadecylmercaptan on Gold Films and Nanoislands:  Effects of Thickness and Morphology of the Gold Layer

Abstract: Infrared spectroscopic ellipsometry (IRSE) of organic self-assembled monolayers (SAMs) commonly uses the external reflection geometry and a three-phase system (bulk substrate, SAM, and ambient medium). In the present work, we study a four-phase system for IRSE, where a gold substrate film is sandwiched between a CaF2 prism and a SAM of octadecylmercaptan (ODM). This sample configuration can be employed for internal reflection IRSE (using a continuous Au film), as well as to boost the detection sensitivity of I… Show more

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Cited by 9 publications
(32 citation statements)
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“…47 We concentrated on optically thick (200 nm), flat samples, combining typical grain size on the scale of microns and homogeneity on the macroscopic scale. These two conditions were achieved using flame-annealed films deposited on glass slides coated with a Cr primer (Arrandee).…”
Section: Preparation Of Substrates and Samsmentioning
confidence: 99%
“…47 We concentrated on optically thick (200 nm), flat samples, combining typical grain size on the scale of microns and homogeneity on the macroscopic scale. These two conditions were achieved using flame-annealed films deposited on glass slides coated with a Cr primer (Arrandee).…”
Section: Preparation Of Substrates and Samsmentioning
confidence: 99%
“…Although a wide variety of substrates and functional groups are known to form SAM, thiol/disulfide monolayers on Au have received considerable attention in recent years [10][11][12][13]. The electron transfer at a thiol modified gold electrode can be influenced by many factors, such as alkyl chain length, active terminal groups and solution pH.…”
Section: Introductionmentioning
confidence: 99%
“…Fortunately, these problems can be recognized with spectroscopic ellipsometry and weaker molecular vibrations can be identified unambiguously with the Kramers−Kronig transformation (KKT). In particular, the KKT presents specific pairs of vibrational features and makes it easier to assign the vibrational modes. Just recently, infrared spectroscopic ellipsometry (IRSE) has been used to characterize SAMs and ultrathin films on metals and semiconductor substrates. In general, chemical bonds such as C−H have different orientations, which may be oblique to the substrate surface . IRSE measures the change of the amplitude and phase for p- and s-polarized light reflected from the samples, whereas in FT-IRRAS and ATR spectroscopy usually unpolarized light is used.…”
Section: Introductionmentioning
confidence: 99%