2012
DOI: 10.7567/jjap.51.080208
|View full text |Cite
|
Sign up to set email alerts
|

InGaP/GaAs Dual-Junction Solar Cell with AlGaAs/GaAs Tunnel Diode Grown on 10° off Misoriented GaAs Substrate

Help me understand this report

Search citation statements

Order By: Relevance

Paper Sections

Select...
1
1

Citation Types

0
3
0

Year Published

2019
2019
2021
2021

Publication Types

Select...
2
1

Relationship

0
3

Authors

Journals

citations
Cited by 3 publications
(3 citation statements)
references
References 14 publications
0
3
0
Order By: Relevance
“…These materials are selected such that the energy gap of the top cell is higher than that of the bottom cell. Therefore, the top cell absorbs the short wavelengths and the bottom cell absorbs the long wavelengths of the input solar radiation spectrum [23,32]. The material of the two BSF layers is selected to passivate the surface recombination among the base of the top cell and the emitter of the GaAs tunnel diode.…”
Section: Design Of the Ingap/gaas Dj Solar Cellmentioning
confidence: 99%
“…These materials are selected such that the energy gap of the top cell is higher than that of the bottom cell. Therefore, the top cell absorbs the short wavelengths and the bottom cell absorbs the long wavelengths of the input solar radiation spectrum [23,32]. The material of the two BSF layers is selected to passivate the surface recombination among the base of the top cell and the emitter of the GaAs tunnel diode.…”
Section: Design Of the Ingap/gaas Dj Solar Cellmentioning
confidence: 99%
“…GaN and AlN, and its alloys (AlGaN) heterostructures is a very interesting materials because of their applications in high-power, high-frequency field effect transistors, light-emitting diodes, and high electron mobility transistors (HEMTs) [1][2][3][4][5][6][7][8] than other materials, such as GaAs or GaP [9][10][11]. To improve the performances of these devices, the electronic properties of the twodimensional electron gas (2DEG) formed in the AlGaN/GaN quantum well is the most important factor.…”
Section: Introductionmentioning
confidence: 99%
“…The surface of the samples was analyzed with an AFM system in contact mode and Photoluminescence (PL) experiments were carried out at 1.4 K using conventional lock-in techniques. Figure 2 shows the AFM images of the 2 samples along the [1][2][3][4][5][6][7][8][9][10] direction can be observed and their size and concentration decrease when the amount of Ga in each cycle is lowered. This is mainly due to the fact that, under this special growth condition, the first Ga layer covers the whole surface while the excess of Ga material forms droplet spread all over the surface that act as reservoirs of Ga material in order to form the GaAs:Si layers during the annealing under As flux [12,13].…”
mentioning
confidence: 99%