Abstract-Avalanche-mode light-emitting diodes (AMLEDs) in silicon (Si) are potential light sources to enable monolithic optical links in standard CMOS technology, due to the large overlap of their electro-luminescent (EL) spectra with the responsivity of Si photo-diodes. These EL spectra depend on the reverse electric field. We present, for the first time, AMLEDs employing the superjunction (SJ) assisted reduced surface field (RESURF) effect which increases the uniformity of their electric field profile. Consequently, the EL area of these lateral devices is significantly enlarged as compared to conventional AMLEDs. Electrical and optical measurements demonstrate RESURF, as predicted by TCAD simulations, and show a direct link between EL-intensity (optical power per unit device area) and the fieldprofile. Contrary to a conventional AMLED, the breakdown voltage of the SJ-LED scales with the device length. Further, the brightest SJ-LED, with a lateral intensity of ∼30 mW cm −2 at an electrical power (P AMLED ) of 0.1 W, shows a 2-fold higher internal quantum efficiency and a 3-fold higher EL-intensity compared to the conventional AMLED for the same P AMLED .