1999
DOI: 10.1016/s0008-6223(98)00268-1
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Insights on the deposition mechanism of sputtered amorphous carbon films

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Cited by 72 publications
(42 citation statements)
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“…It is seen that in the case of HiPIMS deposited films, an increase of V b up to a value of 50 V results in an increase of the sp 3 content in the films followed by a decrease at larger V b values. This trend is in qualitative agreement with results obtained by other PVD techniques, such as PLD [41], FCA [42] and rfMS [16] which are reproduced for reference in Fig. 3.…”
Section: Film Propertiessupporting
confidence: 91%
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“…It is seen that in the case of HiPIMS deposited films, an increase of V b up to a value of 50 V results in an increase of the sp 3 content in the films followed by a decrease at larger V b values. This trend is in qualitative agreement with results obtained by other PVD techniques, such as PLD [41], FCA [42] and rfMS [16] which are reproduced for reference in Fig. 3.…”
Section: Film Propertiessupporting
confidence: 91%
“…Comparison of the mass density and sp 3 fractions measured in amorphous carbon films grown by rfMS (Ref. [16], hollow squares), FCA (Ref. [42], hollow circles), and PLD (Ref.…”
Section: Discussionmentioning
confidence: 99%
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