Inspection of electronics packages using the efficient perception technique

Abstract

When engineers choose and arrange proper lighting sources for an inspection system, many of them rely on their own experience or guesswork without any guidance of theories. This paper discusses the efficient perception technique, i.e. the Torrance‐Sparrow model and its application to the selection and configuration of light emitting diode (LED) lighting sources for a package visual inspection system. Inspection of several typical package samples has been evaluated. The image changes of the sample packages are explained using the Torrance‐Sparrow model. The experimental results with the actual gray level values of the images are compared.

Investigation of light scattering for scratch detection

“…Their image resolution is limited by the Rayleigh criterion, and their sensitivities are relatively low [4]. The light intensity sensing technology senses the variation of the scattered light intensity distribution to detect defects on optical surfaces [5][6][7]. Machine vision often requires digital input/output devices, and is widely used in semiconductor defect detection [8,9].…”