2000
DOI: 10.1016/s0030-4018(00)00872-5
|View full text |Cite
|
Sign up to set email alerts
|

Inspection of micro-cracks on solderball surface using a laser scattering method

Help me understand this report

Search citation statements

Order By: Relevance

Paper Sections

Select...
5

Citation Types

0
6
0

Year Published

2004
2004
2022
2022

Publication Types

Select...
8
1

Relationship

0
9

Authors

Journals

citations
Cited by 20 publications
(6 citation statements)
references
References 7 publications
0
6
0
Order By: Relevance
“…Recently, many nondestructive inspection systems that use light-scattering from foreign matter particles for their detection have been made commercially available for use in product manufacturing. [9][10][11][12][13][14][15][16] However, these systems identify all light scattering as foreign matter particles on the surface. In addition, if microcracks are hidden under the polished surface of products, they cannot be detected by light-scattering alone.…”
Section: Introductionmentioning
confidence: 99%
“…Recently, many nondestructive inspection systems that use light-scattering from foreign matter particles for their detection have been made commercially available for use in product manufacturing. [9][10][11][12][13][14][15][16] However, these systems identify all light scattering as foreign matter particles on the surface. In addition, if microcracks are hidden under the polished surface of products, they cannot be detected by light-scattering alone.…”
Section: Introductionmentioning
confidence: 99%
“…Moreover, the mechanical contact between the stylus and the sample often causes damage. It is well known that the light scattering method has the main advantage of reliability and simplicity [13]. To solve this problem, an optical inspection system based on the light scattering method [14][15][16][17] for rapid surface roughness measurement of AZO thin films is developed in this study.…”
Section: Introductionmentioning
confidence: 99%
“…Commercially available instruments used to detect optical surface defects are mainly based on machine vision technologies. A drawback of some existing methods is the complexity in optical setups and data processing, making them time-consuming and expensive [16]. Their sensitivity is limited, and to inspect defects smaller than several micrometers is difficult.…”
Section: Introductionmentioning
confidence: 99%