2011
DOI: 10.1016/j.optlaseng.2011.03.003
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Surface roughness characterization of Al-doped zinc oxide thin films using rapid optical measurement

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Cited by 11 publications
(2 citation statements)
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“…The scanning measurements confirmed that the orientation and alignment of the nanowires were controlled by the surface texture of the substrate and the roughness of the deposited film seed layers, respectively. According to some studies [ 17 , 18 , 19 ], the thickness and roughness of the seed layers have a greater impact on the alignment of the nanorods than the texture of the substrate. AFM micrographs have been developed in the field of nanotechnology for various applications [ 20 , 21 , 22 , 23 , 24 ].…”
Section: Introductionmentioning
confidence: 99%
“…The scanning measurements confirmed that the orientation and alignment of the nanowires were controlled by the surface texture of the substrate and the roughness of the deposited film seed layers, respectively. According to some studies [ 17 , 18 , 19 ], the thickness and roughness of the seed layers have a greater impact on the alignment of the nanorods than the texture of the substrate. AFM micrographs have been developed in the field of nanotechnology for various applications [ 20 , 21 , 22 , 23 , 24 ].…”
Section: Introductionmentioning
confidence: 99%
“…[4][5][6][7][8][9][10][11]. ZnO thin films can also be used in nanobiotechnological applications [12].…”
Section: Introductionmentioning
confidence: 99%