2002
DOI: 10.1080/10584580215526
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Integration of Piezoelectric PZT Thin Films with Internal Electrodes into an Actuator Structure for MEMS Applications

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Cited by 10 publications
(7 citation statements)
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“…Based on the results of the hysteresis and CV-measurements, a rough estimation of the piezoelectric coefficient d 31 , can be derived by [22][23][24] d 31 ¼ 2e r e 0 P r Q 12 where in the electrostrictive coefficient Q 12 = -3.1 9 10 -2 m 4 /C 2 for the PZT ceramic is assumed as nearly constant. The estimated piezoelectric coefficient for the *1 lm thick PZT film was found to be -134 pC/N.…”
Section: Ferroelectric Propertiesmentioning
confidence: 99%
“…Based on the results of the hysteresis and CV-measurements, a rough estimation of the piezoelectric coefficient d 31 , can be derived by [22][23][24] d 31 ¼ 2e r e 0 P r Q 12 where in the electrostrictive coefficient Q 12 = -3.1 9 10 -2 m 4 /C 2 for the PZT ceramic is assumed as nearly constant. The estimated piezoelectric coefficient for the *1 lm thick PZT film was found to be -134 pC/N.…”
Section: Ferroelectric Propertiesmentioning
confidence: 99%
“…Micro-electromechanical systems (MEMS) have been developing rapidly for a wide variety of applications in the last decade. A wide range of materials have been used in the design and fabrication of MEMS devices and many advanced microfabrication techniques have been developed [1][2][3][4][5]. However, most of the reported piezoelectric MEMS devices are based on lead zirconate titanate (PZT).…”
Section: Introductionmentioning
confidence: 99%
“…The full machinery of IC fabrication can be recruited for high quality mass production. Many author s have reported on their progress towards general purpose displacement actuators, such as Duval et al [1], Luginbuhl et al, [2] and Hoffmann et al [3]. Also many author s have reported on methods to use these devices for energy harvesting purposes, such as Jeon et al [4], Reilly et al [5], Fuentes-Fernandez et al [6], Roundy et al [7] and Choi et al [8] and Kim[9] The application of these devices in Atomic Force Microscopy is reported by Fujii et al [10], while the application in micromechanical switches is described by Gross et al, [11].…”
Section: Introductionmentioning
confidence: 99%