Integration of point-contact microscopy and atomic-force microscopy: Application to characterization of graphite/Pt(111)

Enăchescu, Marius; Schleef, D.; Ogletree, D. Frank; Salmerón, Miquel

doi:10.1103/physrevb.60.16913

Cited by 96 publications

(94 citation statements)

References 29 publications

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“…Enachescu et al reported that a large graphene sheet covers the Pt(111) steps continuously from the upper terrace to the adjacent lower terrace. 6 Ohno et al investigated graphene growth on the Pt(755) stepped surface by LEED and angleresolved ultraviolet photoelectron spectroscopy (ARUPS) 9 and reported similar phenomena. In this case, the sharp diffraction spots of the graphene sheet did not indicate the growth of nanoribbons that were replicas of the original nanostep surfaces, but rather corresponded to the formation of a large sheet.…”

Section: Graphene Sheet Formationmentioning

confidence: 77%

Novel structures of carbon layers on a Pt(111) surface

Fujita

Kobayashi

Oshima

2005

Surface & Interface Analysis

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The growth behaviour of carbon layers formed on a Pt(111) surface has been investigated by means of scanning tunnelling microscopy. A carbon layer with a ( p 19 × p 19)R23.4• structure was grown by benzene exposure of 3 L at 1000 K. After exposure of >10 L, graphene islands with hexagonal shapes appeared in the surface terraces. The graphene islands grew beyond step edges, and their growth often caused bunching of the step edges by Pt atom migration.

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Section: Graphene Sheet Formationmentioning

confidence: 77%

Novel structures of carbon layers on a Pt(111) surface

Fujita

Kobayashi

Oshima

2005

Surface & Interface Analysis

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“…Topography, friction, and point contact current ͑corre-sponding to contact conductance͒ were recorded simultaneously as the tip was scanned over the surface, 25 as shown in Fig. 3.…”

Section: B Contacts Between Fully Passivated Interfaces: Friction Anmentioning

confidence: 99%

The role of contaminants in the variation of adhesion, friction, and electrical conduction properties of carbide-coated scanning probe tips and Pt(111) in ultrahigh vacuum

Enăchescu

Carpick

Ogletree

et al. 2004

Journal of Applied Physics

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Scanning probe microscopy was used to investigate the tribological properties of nanoscale tips in contact with a Pt͑111͒ single-crystal surface under ultrahigh vacuum conditions. The tips were coated with a tungsten carbide film, which contained a significant fraction of oxygen. The electrically conductive tip made it possible to alternate between contact measurements and noncontact scanning tunneling microscopy. Several types of interfaces were found depending on the chemical state of the surfaces. The first type is characterized by strong irreversible adhesion followed by material transfer between tip and sample. Low adhesion and no material transfer characterize a second type of contact, which are associated with the presence of passivating adsorbates in both ͑full passivation͒ or in one of the two contacting surfaces ͑half-passivation͒. Half-passivated contacts in which the clean side is the Pt͑111͒ sample gave rise to periodic stick-slip friction behavior with a period equal to the atomic lattice constant of the Pt͑111͒ surface. Local electrical conductivity measurements show a clear correlation between electronic and friction properties, with ohmic behavior on clean regions of the Pt surface and semiconductor-like behavior on areas covered with adsorbates.

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“…Graphene interacts weakly with Pt, which has been evidenced by the existence of multiple moiré patterns, resulting from multiple graphene domains with di erent orientations relative to the underlying Pt substrate [34,80,90,[103][104][105]. DFT calculations and ARPES measurements of graphene/Pt(111) indicated a Dirac point at 0.30 eV above E F , indicating p−type doping of graphene by the underlying Pt substrate [103,106].…”

Section: Weakly Interacting Graphene/metal Systemsmentioning

confidence: 99%

Probing Electronic Properties of Graphene on the Atomic Scale by Scanning Tunneling Microscopy and Spectroscopy

Gao¹

2014

Graphene and 2D Materials

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Atomic scale investigations of the electronic properties of graphene are playing a crucial role in understanding and tuning the exotic properties of this material for its potential device applications. Scanning tunneling microscopy (STM) and spectroscopy (STS) are unique techniques for atomic scale investigations and have been extensively used in graphene research. In this article, we review recent progresses in STM and STS studies of the electronic properties of suspended graphene as well as graphene supported by di erent substrates including graphite, metals, silicon carbide, silicon dioxide and boron nitride.

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Integration of point-contact microscopy and atomic-force microscopy: Application to characterization of graphite/Pt(111)

Cited by 96 publications

References 29 publications

Novel structures of carbon layers on a Pt(111) surface

Novel structures of carbon layers on a Pt(111) surface

The role of contaminants in the variation of adhesion, friction, and electrical conduction properties of carbide-coated scanning probe tips and Pt(111) in ultrahigh vacuum

Probing Electronic Properties of Graphene on the Atomic Scale by Scanning Tunneling Microscopy and Spectroscopy

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