Intensity sharing between Brillouin and Umklapp scattering in glasses

Buchenau, U.; Wischnewski, A.; Monkenbusch, M.; Schmidt, W.

doi:10.1080/13642819908223090

Cited by 6 publications

(2 citation statements)

References 7 publications

Supporting

Mentioning

Contrasting

Order By: Relevance

“…In particular, the Q-E relations show a similar behaviour for v-SiO 2 and for α-cristobalite in the range of E 7 meV, because of the similarity in local structure of these samples. The behaviour of the pseudo-dispersion relation observed in v-SiO 2 suggests that Umklapp processes also exist (Buchenau et al 1999, Scopigno et al 2001 as well as in the case of glassy Se (Foret et al 1998). The flattening of the dispersion relation centred at around 5 meV (Boson peak) shown in figure 24 is remarkable.…”

Section: Ins For V-siomentioning

confidence: 77%

Boson peak and terahertz frequency dynamics of vitreous silica

2002

View full text Add to dashboard Cite

This paper describes the progress that has been made in the past decade in the investigation of the peculiar dynamic properties of vitreous silica (v-SiO 2 ) and related glasses in the terahertz (THz) frequency range. The reason why we focus our attention on v-SiO 2 is that it is one of the principal network glasses and exhibits all features typical of glasses. These are the increased inelastic scattering of light and neutrons at THz frequencies, the so-called Boson or Bose peak, as well as unusual thermal properties such as specific heats and thermal conductivities at low temperatures. During the last decade, experimental techniques such as the inelastic scattering of light, neutrons and x-rays have been greatly improved, and these have provided considerable experimental information about the atomic vibrations in v-SiO 2 and related glasses in the THz frequency region. In addition, molecular dynamics simulations have proved successful for these complex systems. They form the basis for this perspective on the major advances in this decade from a new and tutorial point of view.

show abstract