2005
DOI: 10.1163/1568561054890516
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Interaction force measurements using atomic force microscopy for characterization and control of adhesion, dispersion and lubrication in particulate systems

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Cited by 10 publications
(4 citation statements)
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“…They concluded that controlling the deformation reduces and even eliminates the effects of nanoroughness on the probe-substrate contact area, promoting conditions described by the contact mechanics models (to be discussed in next section) for the spheresmooth substrate system. AFM finds another application in the exploration of the range of interaction forces [52] which can be utilized to predict, optimize, and design a variety of industrially relevant processes such as chemical mechanical polishing (CMP), powder flow and handling, and nanodispersions. Towards the resolution of the problem of Figure 11: Surface characteristics of worn surfaces of the steel grades investigated when exposed to the pin-on-disc test as observed in the SEM [17].…”
Section: 32mentioning
confidence: 99%
“…They concluded that controlling the deformation reduces and even eliminates the effects of nanoroughness on the probe-substrate contact area, promoting conditions described by the contact mechanics models (to be discussed in next section) for the spheresmooth substrate system. AFM finds another application in the exploration of the range of interaction forces [52] which can be utilized to predict, optimize, and design a variety of industrially relevant processes such as chemical mechanical polishing (CMP), powder flow and handling, and nanodispersions. Towards the resolution of the problem of Figure 11: Surface characteristics of worn surfaces of the steel grades investigated when exposed to the pin-on-disc test as observed in the SEM [17].…”
Section: 32mentioning
confidence: 99%
“…Several studies have dealt with the effect of micrometer/submicrometer-scale roughness on adhesion force, particularly after the colloidal-probe atomic force microscopy (AFM) technique was introduced by Ducker et al Most of these studies reveal that roughness decreases the adhesion force, due to the reduction in real contact area between the probe and the substrate.…”
Section: Introductionmentioning
confidence: 99%
“…The intrinsic roughness and irregular morphology of processed excipient and APIs in OIDP formulations, has severely limited the general use of colloid probe microscopy [93]. Most studies produced high variability in colloid probe adhesion measurements between formulation components, because it led to significant variation in the contact area between the colloidal probe and substrate, to which adhesion is directly proportional [94].…”
Section: Atomic Force Microscopy (Afm)mentioning
confidence: 99%