Interaction of water with glass at very high temperature under dynamic condition and the properties of the obtained glass surface

Expected mechanism and characteristics of aqua-float process

“…Most of the results of preliminary experiments were reported previously [3][4][5][6]. The mimic experiment to observe the thickness of steam layer showed it to be fairly stable in the range of 100-300 l depending upon the measurement conditions.…”

“…Conventional soda-lime-silicate glass cullet composed of SiO 2 (70% by weight), Al 2 (10%), MgO (4%) and other minor ingredients such as Fe 2 O 3 and SO 3 was used for the semi-continuous experiments as in batch experiments [5]. Specific hydrophilic, porous carbon materials having the properties listed in Table 1 were used as steam evolving substrate to sustain the glass melt.…”

“…We have already reported some results on preliminary and real experiments [3][4][5][6] and this report mainly deals with the analysis of the process based on our experimental results in view of heat transfer and energy balance, fluid dynamics of steam, behavior of glass under stress and comparison with gas-float process. These studies and experimental results lead us to expect some advantageous characteristics of the process.…”

Structural and compositional characterization of MOVPE GaN thin films transferred from sapphire to glass substrates using chemical lift-off and room temperature direct wafer bonding and GaN wafer scale MOVPE growth on ZnO-buffered sapphire

“…Similar interfacial layers have been widely reported for various materials bonded in this way and they are observed to exhibit thicknesses ranging from a few nm up to about 20 nm, depending on the nature of the bonded materials. The origin of such interlayers is still not fully understood, but it has been reported that it could be a ''semiconductor oxide'' layer [12] and/or a contamination with organic material during the wafer bonding process and/or attributable to glass corrosion by air due to the sodium and potassium lixiviation associated with reaction with carbon dioxide [20,21].…”

Precise XPS depth analysis of soda–lime–silica glass surface after various treatments

“…The depth profile analysis of glass surface has been carried out to investigate the diffusivities of mobile ions and the chemical durability of glass. [1][2][3] Information about depth profiles is helpful to investigate the mechanism of the leaching process and to estimate the leaching behavior. Some surface analytical tools, such as XPS, AES, and SIMS, have been typically employed for the evaluation of glass surface combined with ion sputtering using such ions as Ar + .…”