1988
DOI: 10.1016/0038-1098(88)90209-8
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Interband critical point parameters determined by ellipsometry in ZnxHg1−xSe

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Cited by 9 publications
(13 citation statements)
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“…(1) The values of a, 6, and c for CdHgSe are listed in Table 1 together with those of CdHgSe calculated from the peak positions of reflection spectra [4] and those obtained from ellipsometric measurements for ZnHgSe [8] and CdHgTe [9].…”
Section: Resultsmentioning
confidence: 99%
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“…(1) The values of a, 6, and c for CdHgSe are listed in Table 1 together with those of CdHgSe calculated from the peak positions of reflection spectra [4] and those obtained from ellipsometric measurements for ZnHgSe [8] and CdHgTe [9].…”
Section: Resultsmentioning
confidence: 99%
“…3 as a function of x. The crosses and triangles denote the broadening parameters taken from the ellipsometric data of ZnHgSe large difference may be due to surface effects [8] originating from the following mechanisms.…”
Section: Resultsmentioning
confidence: 99%
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