2004
DOI: 10.1016/j.jnoncrysol.2004.08.026
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Interconversion between non-bridging oxygen hole center and peroxy radical in F2-laser-irradiated SiO2 glass

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Cited by 11 publications
(9 citation statements)
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“…The reaction Eq. (10) is slower in a sample with a higher fictive temperature [99], implying that O 0 is less mobile in more disordered a-SiO 2 network. F 2 laser irradiation to a-SiO 2 containing both SiCl groups and interstitial O 2 produces interstitial chlorinerelated radicals (ClO Å…”
Section: Thermal Diffusion and Reactionsmentioning
confidence: 97%
“…The reaction Eq. (10) is slower in a sample with a higher fictive temperature [99], implying that O 0 is less mobile in more disordered a-SiO 2 network. F 2 laser irradiation to a-SiO 2 containing both SiCl groups and interstitial O 2 produces interstitial chlorinerelated radicals (ClO Å…”
Section: Thermal Diffusion and Reactionsmentioning
confidence: 97%
“…An analysis of the changes observed in the concentration of these centers under irradiation makes it possible to judge the transformations occurring in the microstructure of the material, to evaluate the deviation of the composition from stoichiometry, and to determine the degree of radiationinduced amorphization of crystalline SiO 2 modifications [2,[5][6][7]. Defect centers of this type can exist not only in silica glass but also in the structure of other amorphous matrices based on SiO 2 .…”
Section: Introductionmentioning
confidence: 99%
“…Optical absorption spectrum was measured with a Jasco-V570 UV-vis-NIR spectrophotometer. The g 1 = 4.2636 signal should be ascribed to Fe 3+ impurity 12 responsible for the 400 nm emission in SSC, while the other two may be associated with paramagnetic defects in silicate glasses [13][14][15] or impurities ͑e.g., Cu 2+ , Fe 3+ ͒ ͑Ref. Electron spin resonance ͑ESR͒ measurements were carried out by using a JES-TE100 ESR spectrometer operating at X-band microwave frequency to detect paramagnetic defects and impurities in the glasses.…”
mentioning
confidence: 99%