Interelement effects in X-ray fluorescence determination of the surface density of vanadium nanofilms on various substrates

2014 Atomic Spectrometry Update – a review of advances in X-ray fluorescence spectrometry

“…Mashin et al 410 studied the effect of the uorescence from bulk substrates on the uorescent intensity of vanadium nanolms of various thicknesses and examined V Ka uorescence enhancement by emission from the substrate. The authors calculated correction coefficients that took into account lm-substrate inter-element effects for the analysis of real nanolm structures.…”

Determination of the Mass Absorption Coefficient in Two-Layer Ti/V and V/Ti Thin Film Systems by the X-Ray Fluorescence Method

“…In determining mass absorption coeffi cients taking into account attenuation of the primary radiation of the X-ray tube and attenuation of spectral lines of the lower layer elements in the upper layer, a very time-consuming technique was used which entailed applying a second layer onto one-layer single-component fi lms. The resulting two-layer systems could not be used further in the study of other structures.Application of the simple to manufacture unifi ed one-layer single-component layers, obtained by deposition of elements on a polymer fi lm substrate [(C 10 H 8 O 4 ) n ], is proposed here for the determination of the mass absorption coeffi cients of X-ray fl uorescence of Ge atoms (lower layer) for Ti, Ni, V, or Cr (upper layer) found in two-layer systems on polycore substrates [5,6]. Combination of Ge layers on the polycore and Ti, Ni, V, or Cr deposited on a polymer fi lm, when arranged in a particular way, allowed to form composites identical to the systems of two-layer fi lm structures subject to analysis.…”

“…Application of the simple to manufacture unifi ed one-layer single-component layers, obtained by deposition of elements on a polymer fi lm substrate [(C 10 H 8 O 4 ) n ], is proposed here for the determination of the mass absorption coeffi cients of X-ray fl uorescence of Ge atoms (lower layer) for Ti, Ni, V, or Cr (upper layer) found in two-layer systems on polycore substrates [5,6]. Combination of Ge layers on the polycore and Ti, Ni, V, or Cr deposited on a polymer fi lm, when arranged in a particular way, allowed to form composites identical to the systems of two-layer fi lm structures subject to analysis.…”

“…In the auxiliary systems, thin layers of titanium and vanadium (<350 nm) were applied to a polymer fi lm with a thickness of 5 microns. Titanium fi lms were obtained by ion-plasma sputtering in a vacuum [5] on the URM-3.279.026 unit, vanadium fi lms -by electron beam evaporation using a photometric thickness monitoring system [6] on a commercial vacuum unit VU-1A. The pressure of the residual atmosphere before sputtering was 2·10 -4 Pa. A preliminary degassing of the substrates before sputtering was carried out at a temperature of 160 ± 5 o C. The starting materials were target cells of the investigated elements (at least 99.9% pure) in the form of bulk samples that were used later for determining the relative intensities 0 A A I I ∞ .…”