1999
DOI: 10.1016/s0257-8972(99)00373-4
|View full text |Cite
|
Sign up to set email alerts
|

Interesting optical properties of films composed of very small grains formed from a high-rate nanoparticle beam

Help me understand this report

Search citation statements

Order By: Relevance

Paper Sections

Select...
3
2

Citation Types

1
4
0

Year Published

2001
2001
2015
2015

Publication Types

Select...
6

Relationship

0
6

Authors

Journals

citations
Cited by 7 publications
(5 citation statements)
references
References 12 publications
1
4
0
Order By: Relevance
“…Within the abrupt slope (500-700 nm), the refractive indices of samples A and B present decreases of about 0.8 and 0.6, respectively. The result is similar to the property of the Cu thin film reported by Urban et al 24 The variation range of the refraction indices for samples A and B are 1.37-0.49 and 1.20-0.23 in the wavelength range of 300-1000 nm. The refractive index n of sample B is much higher in the measured wavelength range, which results from the denser surface.…”
Section: Optical Propertiessupporting
confidence: 90%
See 1 more Smart Citation
“…Within the abrupt slope (500-700 nm), the refractive indices of samples A and B present decreases of about 0.8 and 0.6, respectively. The result is similar to the property of the Cu thin film reported by Urban et al 24 The variation range of the refraction indices for samples A and B are 1.37-0.49 and 1.20-0.23 in the wavelength range of 300-1000 nm. The refractive index n of sample B is much higher in the measured wavelength range, which results from the denser surface.…”
Section: Optical Propertiessupporting
confidence: 90%
“…There are evident troughs at about 570 nm. 24 Sample B has a higher extinction coefficient. The extinction coefficient k represents the absorption coefficient that is proportional to the absorption coefficient a.…”
Section: Optical Propertiesmentioning
confidence: 94%
“…In this study a spectroscopic ellipsometer, combined with a gas handling system, was employed to monitor the changes of the nanoparticle films during exposure to chemical vapours. The ability to measure the ellipsometric properties of the film at multiple wavelengths and variable angles allows a more reliable determination of film properties [18,19].…”
Section: Introductionmentioning
confidence: 99%
“…Only then can the unique physical and chemical properties of such structures be studied, understood, and applied. 8,9 The general objectives of the work presented here are: ͑1͒ Among the most prominent of these areas is the use of nanoscale materials in magnetic data storage.…”
Section: Introductionmentioning
confidence: 99%