Abstract:Multilayer InSb/CdTe and InSb/MnTe heterostructures are grown by molecular beam epitaxy. The analysis of multilayer structures by transmission electron microscopy (TEM) and x-ray rocking curves confirms the presence of periodic heterointerfaces. TEM, x-ray, and x-ray photoelectron spectroscopy (XPS) measurements are found to provide a sensitive indicator for the presence of ultra-thin interfacial layers. Double barrier structures in the MnTe/InSb/MnTe configuration exhibit the negative differential resistance … Show more
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