2006
DOI: 10.1088/0957-4484/17/16/002
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Interface study on heterostructured GaP–GaAs nanowires

Abstract: The interface chemical composition of heterostructured GaP-GaAs nanowire segments was studied by the use of energy-dispersive x-ray analysis. An arsenic-rich tail in the GaP segments following GaAs could be minimized by reducing the AsH(3) molar fraction and the growth rate. For the temperature regime used for vapour-liquid-solid growth, we observe the opposite trend on interface sharpness compared to high-temperature layer-by-layer growth, that is, the sharpness of the interface improves with reducing tempera… Show more

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Cited by 65 publications
(70 citation statements)
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“…Therefore the Si vapor source still had a normalized strength 1, and the total vapor strength was 1.1. However, as long as α is small which was satisfied in the experiment, (8) and (9) can closely approximate the results.…”
Section: A Quantitative Application: Fit Of a Set Of Experimental Resmentioning
confidence: 59%
See 4 more Smart Citations
“…Therefore the Si vapor source still had a normalized strength 1, and the total vapor strength was 1.1. However, as long as α is small which was satisfied in the experiment, (8) and (9) can closely approximate the results.…”
Section: A Quantitative Application: Fit Of a Set Of Experimental Resmentioning
confidence: 59%
“…First, (8) and (9) are used to fit an experimentally measured concentration profile of a Si-Ge junction, and second, (10) is used to fit a set of junction abruptness data, all due to Clark et al [5]. The calculated and experimental results of the Si-Ge concentration profile are shown together in Fig.…”
Section: A Quantitative Application: Fit Of a Set Of Experimental Resmentioning
confidence: 99%
See 3 more Smart Citations