“…Scanning electron microscopy (SEM, JEOL, Japan) coupled with energy-dispersive X-ray spectroscopy (EDS, Oxford Instrument, UK), X-ray diffraction (XRD, Bruker D8 Advance, Germany), thermogravimetric-differential thermal analysis (TG-DTA, NETZSCH, Germany), Brunauer-Emmet-Teller (ThermoFisher, USA), Fourier transform infrared (FT-IR, Nicolet 6700, MA, USA), Raman spectroscopy (i-RamanPlus, B&W Tek Inc., USA), and X-ray photoelectron spectroscopy (XPS, ESCALAB Xi+, ThermoFischer, USA) were employed to characterize the morphology, structures, surface elements, and functional groups of the experienced PS. , The characterization results of the original PS were reported in our previous study, and a comparison with the experienced PS was further investigated. The carbonyl index (CI) was calculated from the FT-IR spectra using eq , and CI values for the PS were obtained by comparing the FT-IR absorption band at 1720 cm –1 with the reference band at 1451 cm –1 . normalCI = normalabsorption intensity at carbonyl groups .25em ( ∼ 1870 − 1650 cm − 1 ) normalabsorption intensity at constant internal band .25em ( ∼ 1500 − 1420 cm − 1 ) …”