2009 International Conference on Electronic Packaging Technology &Amp; High Density Packaging 2009
DOI: 10.1109/icept.2009.5270671
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Interfacial reaction of reballed BGAs under isothermal aging conditions

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Cited by 1 publication
(2 citation statements)
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“…14. In past studies [11], [12], [14], it was discovered that there was a higher local stress concentration at the inner fillet surface of the bulk solder behind the heel of the lead. Based on this past knowledge and observation of the crack path in this study, it is likely that the crack initiated at the inner fillet (location 3) behind the heel, propagated under the lead (location 2), and finished out at the toe (location 1).…”
Section: Microsectional Analysismentioning
confidence: 99%
See 1 more Smart Citation
“…14. In past studies [11], [12], [14], it was discovered that there was a higher local stress concentration at the inner fillet surface of the bulk solder behind the heel of the lead. Based on this past knowledge and observation of the crack path in this study, it is likely that the crack initiated at the inner fillet (location 3) behind the heel, propagated under the lead (location 2), and finished out at the toe (location 1).…”
Section: Microsectional Analysismentioning
confidence: 99%
“…Rework of plated through hole and ball grid array (BGA) assemblies has been addressed in the past [6], [7], [11], [12]. However, very limited literature has investigated the effect of rework on gull-wing type of packages and chip components [1], [13].…”
Section: Introductionmentioning
confidence: 99%