2007
DOI: 10.1063/1.2764244
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Interference lithography by a soft x-ray laser beam: Nanopatterning on photoresists

Abstract: We have studied the feasibility of high-resolution laser interference lithography using a tabletop 46.9nm, 1.5ns Ar laser, combined with two different optical configurations based on a Lloyd’s mirror interferometer. Using one of these schemes we have encoded periodic grating structures with a half pitch of 42nm and a vertical modulation of 5nm on a commercial PMMA photoresist. Experiments performed with larger half-pitch structures and detailed theoretical calculations demonstrate the potentiality of producing… Show more

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Cited by 38 publications
(30 citation statements)
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“…Table top EUV lasers in combination with a Lloyd's interferometer were also used to print lines and two dimensional arrays of holes and pillars in different photoresists [51,[80][81][82]. Both beams converge at the edge of the mirror on the sample to give rise to a sinusoidal intensity pattern of period d, defined by the wavelength of the light l and the incidence angle y according to Eq.…”
Section: Article In Pressmentioning
confidence: 99%
“…Table top EUV lasers in combination with a Lloyd's interferometer were also used to print lines and two dimensional arrays of holes and pillars in different photoresists [51,[80][81][82]. Both beams converge at the edge of the mirror on the sample to give rise to a sinusoidal intensity pattern of period d, defined by the wavelength of the light l and the incidence angle y according to Eq.…”
Section: Article In Pressmentioning
confidence: 99%
“…IL is based on interference between two or more coherent laser beams in a Lloyd's mirror interferometer [6] and Mach-Zehnder interferometer [7]. Because of the nature of interference, periodicity is guaranteed if the beam wavefront quality and uniformity are sufficiently good over the required surface area of overlap.…”
Section: Introductionmentioning
confidence: 99%
“…After early interference lithography experiments performed in the vacuum UV 1 and EUV regions, 2 dedicated EUV-IL tools have been set up using synchrotron 3,4 and laser sources. 5 Such tools using plasmabased EUV sources are also being considered. 6 In most reported EUV-IL work, the wavelength of choice has been 13.4 nm.…”
Section: Introductionmentioning
confidence: 99%